Analog Devices ADF7021-V Manuel utilisateur

High Performance,

Narrow-Band Transceiver IC

ADF7021-V

Rev. 0

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FEATURES

High performance, low power, narrow-band transceiver

Enhanced performance ADF7021-N with external VCO

Frequency bands using external VCO: 80 MHz to 960 MHz

Improved adjacent channel power (ACP) and adjacent

channel rejection (ACR) compared with the ADF7021-N

Programmable IF filter bandwidths: 9 kHz, 13.5 kHz,

and 18.5 kHz

Modulation schemes: 2FSK, 3FSK, 4FSK, MSK

Spectral shaping: Gaussian and raised cosine filtering

Data rates: 0.05 kbps to 24 kbps

Power supply: 2.3 V to 3.6 V

Programmable output power: −16 dBm to +13 dBm

in 63 steps

Automatic power amplifier (PA) ramp control

Receiver sensitivity

−125 dBm at 250 bps, 2FSK

−122 dBm at 1 kbps, 2FSK

Patent pending, on-chip image rejection calibration

On-chip fractional-N PLL

On-chip, 7-bit ADC and temperature sensor

Fully automatic frequency control (AFC) loop

Digital received signal strength indication (RSSI)

Integrated Tx/Rx switch

Leakage current in power-down mode: 0.1 μA

APPLICATIONS

Narrow-band, short-range device (SRD) standards

ETSI EN 300 220

500 mW output power capability in 869 MHz g3 subband

with external PA

High performance receiver rejection, blocking, and

adjacent channel power (ACP)

FCC Part 90 (meets Emission Mask D requirements)

FCC Part 95

ARIB STD-T67

Wireless metering

Narrow-band wireless telemetry

FUNCTIONAL BLOCK DIAGRAM

2FSK

3FSK

4FSK

DEMODULATOR

CLOCK

AND DATA

RECOVERY

7-BIT ADC

GAIN

DIV R

RFOUT

LNA

PFD

BUFFER

OSC1 OSC2

N/N + 1

DIV P

OSC

CLKOUT

TEST MUX

CPOUT

LDO[1:4]

MUXOUT

RSET C

EG[1:4]CE

ADF7021-V

TxRxCLK

SWD

TxRxDATA

SLE

SDATA

SREAD

SCLK

IF FILTER

PA RAMP

MUX

2FSK

3FSK

4FSK

MOD CONTROL

GAUSSIAN/

RAISED COSINE

FILTER

3FSK

ENCODING

÷1/÷2

÷2

8635-001

CLK

DIV

Σ-Δ

MODULATOR

SERIAL

PORT

Tx/Rx

CONTROL

AGC

CONTROL

AFC

CONTROL

TEMP

SENSOR

RSSI/

LOG AMP

LNA

RFIN

Figure 1.

ADF7021-V

Rev. 0 | Page 2 of 60

TABLE OF CONTENTS

Features .............................................................................................. 1

Applications....................................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

General Description......................................................................... 3

Specifications..................................................................................... 4

RF and PLL Specifications........................................................... 4

Transmission Specifications........................................................ 5

Receiver Specifications ................................................................ 6

Digital Specifications ................................................................... 9

General Specifications ............................................................... 10

Timing Characteristics .............................................................. 10

Timing Diagrams........................................................................ 11

Absolute Maximum Ratings.......................................................... 14

ESD Caution................................................................................ 14

Pin Configuration and Function Descriptions........................... 15

Typical Performance Characteristics ........................................... 17

Frequency Synthesizer ................................................................... 21

Reference Input........................................................................... 21

MUXOUT.................................................................................... 22

Voltage Controlled Oscillator (VCO) ...................................... 23

Choosing a VCO for Best System Performance ..................... 23

Transmitter ...................................................................................... 24

RF Output Stage.......................................................................... 24

Modulation Schemes.................................................................. 24

Spectral Shaping ......................................................................... 26

Modulation and Filtering Options........................................... 27

Transmit Latency ........................................................................ 27

Test Pattern Generator............................................................... 27

Receiver Section.............................................................................. 28

RF Front End............................................................................... 28

IF Filter......................................................................................... 28

RSSI/AGC.................................................................................... 28

Demodulation, Detection, and CDR....................................... 30

Receiver Setup............................................................................. 32

FSK Demodulator Optimization.............................................. 33

AFC Operation ........................................................................... 34

Automatic Sync Word Detection (SWD)................................ 35

Applications Information .............................................................. 36

IF Filter Bandwidth Calibration............................................... 36

LNA/PA Matching...................................................................... 37

Image Rejection Calibration ..................................................... 38

Packet Structure and Coding.................................................... 39

Programming After Initial Power-Up ..................................... 39

Applications Circuit................................................................... 42

Serial Interface ................................................................................ 43

Readback Format........................................................................ 43

Interfacing to a Microcontroller/DSP ..................................... 44

Outline Dimensions....................................................................... 60

Ordering Guide .......................................................................... 60

REVISION HISTORY

4/10—Revision 0: Initial Version

ADF7021-V

Rev. 0 | Page 3 of 60

GENERAL DESCRIPTION

The ADF7021-V is a high performance, low power, narrow-band

RF transceiver based on the ADF7021-N. The architecture of

the ADF7021-V transceiver is similar to that of the ADF7021-N

except that an external VCO is used by the on-chip RF synthesizer

for applications that require improved phase noise performance.

The ADF7021-V is designed to operate in both the license-free

ISM bands and in the licensed bands from 80 MHz to 960 MHz.

To minimize RF feedthrough and spurious emissions, the

external VCO operates at 2× or 4× the desired RF frequency;

the ADF7021-V supports a maximum VCO frequency operation

of 1920 MHz. The 4× VCO operation is programmable by

enabling an additional on-chip divide-by-2 outside the RF

synthesizer loop and offers improved phase noise performance.

As with the ADF7021-N receiver, the IF filter bandwidths

of 9 kHz, 13.5 kHz, and 18.5 kHz are supported, making the

ADF7021-V ideally suited to worldwide narrow-band telemetry

applications.

The part has both Gaussian and raised cosine transmit data

filtering options to improve spectral efficiency for narrow-band

applications. It is suitable for circuit applications targeted at the

following:

•European ETSI EN 300 220

•North American FCC Part 15, Part 90, and Part 95

•Japanese ARIB STD-T67

•Korean short-range device regulations

•Chinese short-range device regulations

A complete transceiver can be built using a small number of

discrete external components, making the ADF7021-V very

suitable for area-sensitive, high performance driven applications.

The range of on-chip FSK modulation and data filtering options

allows users greater flexibility in their choice of modulation

schemes while meeting the tight spectral efficiency requirements.

The ADF7021-V also supports protocols that dynamically switch

among 2FSK, 3FSK, and 4FSK to maximize communication

range and data throughput.

The transmit section contains a low noise fractional-N PLL with

an output resolution of <1 ppm. The frequency-agile PLL allows

the ADF7021-V to be used in frequency-hopping spread spectrum

(FHSS) systems. The VCO is external, which provides better

phase noise and thus lower adjacent channel power (ACP) and

adjacent channel rejection (ACR) compared with the ADF7021-N.

The VCO tuning range extends from 0.2 V to 2 V, which should

be taken into account when choosing the external VCO.

The transmitter output power is programmable in 63 steps from

−16 dBm to +13 dBm and has an automatic power amplifier ramp

control to prevent spectral splatter and help meet regulatory

standards. The transceiver RF frequency, channel spacing, and

modulation are programmable using a simple 3-wire interface.

The device operates with a power supply range of 2.3 V to 3.6 V

and can be powered down when not in use.

A low IF architecture is used in the receiver (100 kHz), which

minimizes power consumption and the external component

count yet avoids dc offset and flicker noise at low frequencies.

The IF filter has programmable bandwidths of 9 kHz, 13.5 kHz,

and 18.5 kHz. The ADF7021-V supports a wide variety of pro-

grammable features, including Rx linearity, sensitivity, and IF

bandwidth, allowing the user to trade off receiver sensitivity

and selectivity against current consumption, depending on

the application. The receiver also features a patented automatic

frequency control (AFC) loop with programmable pull-in range

that allows the PLL to remove the frequency error in the

incoming signal.

The receiver achieves an image rejection performance of 50 dB

using a patent-pending IR calibration scheme that does not

require the use of an external RF source.

An on-chip ADC provides readback of the integrated temper-

ature sensor, external analog input, battery voltage, and RSSI

signal, which can eliminate the need for an external ADC in

some applications. The temperature sensor is accurate to ±10°C

over the full operating temperature range of −40°C to +85°C.

This accuracy can be improved by performing a one-point cali-

bration at room temperature and storing the result in memory.

ADF7021-V

Rev. 0 | Page 4 of 60

SPECIFICATIONS

VDD = 2.3 V to 3.6 V, GND = 0 V, TA= TMIN to TMAX, unless otherwise noted. Typical specifications are at VDD = 3 V, TA= 25°C. All

measurements are performed with the EVAL-ADF7021-VDBxZ using the PN9 data sequence, unless otherwise noted. The version

number of ETSI EN 300 200-1 is V2.3.1. LBW = loop bandwidth and IFBW = IF filter bandwidth.

RF AND PLL SPECIFICATIONS

Table 1.

Parameter Min Typ Max Unit Test Conditions/Comments

RF CHARACTERISTICS

Phase Frequency Detector (PFD)

Frequency

RF/256 24 MHz Maximum usable PFD at a particular RF frequency

is limited by the minimum N divider value

PHASE-LOCKED LOOP (PLL)

Normalized In-Band Phase Noise

Floor1

−203 dBc/Hz

PLL Settling 155 μs Measured for a 100 kHz frequency step to within

5 ppm accuracy, PFD = 19.68 MHz, LBW = 8 kHz

EXTERNAL VCO

Tuning Range 0.2 2 V

Pin L2 Input Sensitivity 0 dBm VCO frequency < 1920 MHz

REFERENCE INPUT

Crystal Reference23.625 24 MHz

External Oscillator2, 3

3.625 24 MHz

Crystal Start-Up Time410 MHz XTAL, 33 pF load capacitors, VDD = 3.0 V

XTAL Bias = 20 μA 0.930 ms

XTAL Bias = 35 μA 0.438 ms

Input Level for External Oscillator

OSC1 Pin 0.8 V p-p Clipped sine wave

OSC2 Pin CMOS levels V

ADC PARAMETERS VDD = 2.3 V to 3.6 V, TA= 25°C

Integral Nonlinearity (INL) ±0.4 LSB

Differential Nonlinearity (DNL) ±0.4 LSB

1This value can be used to calculate the in-band phase noise for any operating frequency. Use the following equation to calculate the in-band phase noise performance

as seen at the power amplifier (PA) output: −203 + 10 log(fPFD) + 20 logN.

2Guaranteed by design. Sample tested to ensure compliance.

3A TCXO, VCXO, or OCXO can be used as an external oscillator.

4Crystal start-up time is the time from chip enable (CE) being asserted to correct clock frequency on the CLKOUT pin.

ADF7021-V

Rev. 0 | Page 5 of 60

TRANSMISSION SPECIFICATIONS

LBW = loop bandwidth.

Table 2.

Parameter Min Typ Max Unit Test Conditions/Comments

DATA RATE Limited by the loop bandwidth

2FSK 0.05 18.5 kbps LBW must be ≥1.25 × data rate for correct operation

3FSK 0.05 18.5 kbps LBW = 18.5 kHz

4FSK 0.05 24 kbps LBW = 18.5 kHz

MODULATION

Frequency Deviation (fDEV) 0.056 28.26 kHz PFD = 3.625 MHz

0.306 156 kHz PFD = 20 MHz

Frequency Deviation Resolution 56 Hz PFD = 3.625 MHz

Gaussian Filter Bandwidth Time (BT) 0.5

Raised Cosine Filter Alpha 0.5/0.7 Programmable

TRANSMIT POWER

Maximum Transmit Power113 dBm VDD = 3.0 V, TA= 25°C

Transmit Power Variation vs.

Temperature

±1 dB TA= −40°C to +85°C

Transmit Power Variation vs. VDD ±1 dB VDD = 2.3 V to 3.6 V at 915 MHz, TA= 25°C

Transmit Power Flatness ±1 dB 902 MHz to 928 MHz, VDD = 3 V, TA= 25°C

Programmable Step Size 0.3125 dB −16 dBm to +13 dBm

ADJACENT CHANNEL POWER (ACP) Gaussian 2FSK modulation, 13 dBm output power,

PFD = 19.68 MHz, LBW = 6 kHz

460 MHz

12.5 kHz Channel Spacing −47 dBm Measured in a ±8.5 kHz bandwidth at ±12.5 kHz

offset, 2.4 kbps PN9 data, fDEV = 1.2 kHz

25 kHz Channel Spacing −53 dBm Measured in a ±16 kHz bandwidth at ±25 kHz

offset, 4.8 kbps PN9 data, fDEV = 2.4 kHz

868 MHz Compliant with ETSI EN 300 220

12.5 kHz Channel Spacing −44 dBm Measured in a ±8.5 kHz bandwidth at ±12.5 kHz

offset, 2.4 kbps PN9 data, fDEV = 1.2 kHz

25 kHz Channel Spacing −49 dBm Measured in a ±16 kHz bandwidth at ±25 kHz

offset, 4.8 kbps PN9 data, fDEV = 2.4 kHz

MODULATION BANDWIDTH 869.525 MHz, Gaussian 2FSK modulation, 4.8 kbps,

fDEV = 2.4 kHz, 10 dBm output power,2compliant

with ETSI EN 300 220, LBW = 6 kHz

125 kHz Offset −74.5 dBm/1 kHz

125 kHz + 200 kHz −79 dBm/1 kHz

125 kHz + 400 kHz −69.5 dBm/10 kHz

125 kHz + 1 MHz −62 dBm/100 kHz

EMISSION MASK FCC Part 90 Emission Mask D, 100 Hz resolution

bandwidth, Gaussian 2FSK modulation, LBW =

6 kHz, 10 dBm output power, 2.4 kbps PN9 data,

fDEV = 1.2 kHz

12.5 kHz Offset

460 MHz −77 dBc

OCCUPIED BANDWIDTH 99.0% of total mean power, LBW = 6 kHz, 10 dBm

output power

2FSK, Gaussian Data Filtering

12.5 kHz Channel Spacing 4.0 kHz 2.4 kbps PN9 data, fDEV = 1.2 kHz

25 kHz Channel Spacing 8.5 kHz 4.8 kbps PN9 data, fDEV = 2.4 kHz

2FSK, Raised Cosine Data Filtering

12.5 kHz Channel Spacing 4.5 kHz 2.4 kbps PN9 data, fDEV = 1.2 kHz

25 kHz Channel Spacing 9.6 kHz 4.8 kbps PN9 data, fDEV = 2.4 kHz

ADF7021-V

Rev. 0 | Page 6 of 60

Parameter Min Typ Max Unit Test Conditions/Comments

3FSK, Raised Cosine Filtering

12.5 kHz Channel Spacing 4.3 kHz 2.4 kbps PN9 data, fDEV = 1.2 kHz

25 kHz Channel Spacing 8.5 kHz 4.8 kbps PN9 data, fDEV = 2.4 kHz

4FSK, Raised Cosine Filtering

25 kHz Channel Spacing 11.3 kHz 9.6 kbps PN9 data, fDEV = 1.2 kHz

SPURIOUS EMISSIONS

Reference Spurs −65 dBc LBW = 8 kHz

HARMONICS313 dBm output power

Second Harmonic −35/−52 dBc Unfiltered conductive/filtered conductive

Third Harmonic −43/−60 dBc Unfiltered conductive/filtered conductive

All Other Harmonics −36/−65 dBc Unfiltered conductive/filtered conductive

OPTIMUM PA LOAD IMPEDANCE

fRF = 915 MHz 39 + j61 Ω

fRF = 868 MHz 48 + j54 Ω

fRF = 470 MHz 97.5 + j64.4 Ω

fRF = 450 MHz 98 + j65 Ω

fRF = 426 MHz 100 + j65 Ω

fRF = 315 MHz 129 + j63 Ω

fRF = 175 MHz 173 + j49 Ω

fRF = 169 MHz 74.5 + j48.5 Ω

1Measured as maximum unmodulated power.

2Suitable for ETSI 500 mW Tx requirements.

3Conductive filtered harmonic emissions measured on the EVAL-ADF7021-VDBxZ, which includes a T-stage harmonic filter (two inductors and one capacitor).

RECEIVER SPECIFICATIONS

LBW = loop bandwidth and IFBW = IF filter bandwidth.

Table 3.

Parameter Min Typ Max Unit Test Conditions/Comments

DATA RATE Limited by the IF filter bandwidth1

2FSK 0.05 9.0 kbps IFBW = 9 kHz

0.05 13.5 kbps IFBW = 13.5 kHz

0.05 18.5 kbps IFBW = 18.5 kHz

3FSK 0.05 18.5 kbps IFBW = 18.5 kHz

4FSK 0.05 24 kbps IFBW = 18.5 kHz

SENSITIVITY Bit error rate (BER) = 10−3

2FSK

Sensitivity at 0.25 kbps −125 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 1 kbps −122 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 2.4 kbps −119 dBm fDEV = 1.2 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 4.8 kbps −116 dBm fDEV = 2.4 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 9.6 kbps −114 dBm fDEV = 4.8 kHz, high sensitivity mode, IFBW = 18.5 kHz

Gaussian 2FSK

Sensitivity at 0.25 kbps −125 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 1 kbps −122 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 2.4 kbps −120 dBm fDEV = 1.2 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 4.8 kbps −117 dBm fDEV = 2.4 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 9.6 kbps −114 dBm fDEV = 4.8 kHz, high sensitivity mode, IFBW = 18.5 kHz

GMSK

Sensitivity at 4.8 kbps −114.5 dBm fDEV = 1.2 kHz, high sensitivity mode, IFBW = 9.0 kHz

ADF7021-V

Rev. 0 | Page 7 of 60

Parameter Min Typ Max Unit Test Conditions/Comments

Raised Cosine 2FSK

Sensitivity at 0.25 kbps −125 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 1 kbps −121 dBm fDEV = 1 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 2.4 kbps −120 dBm fDEV = 1.2 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 4.8 kbps −115 dBm fDEV = 2.4 kHz, high sensitivity mode, IFBW = 9.0 kHz

Sensitivity at 9.6 kbps −114 dBm fDEV = 4.8 kHz, high sensitivity mode, IFBW = 18.5 kHz

3FSK

Sensitivity at 4.8 kbps −110 dBm fDEV = 2.4 kHz, high sensitivity mode, IFBW = 18.5 kHz,

Viterbi detection on

Raised Cosine 3FSK

Sensitivity at 4.8 kbps −110 dBm fDEV = 2.4 kHz, high sensitivity mode, IFBW = 13.5 kHz,

alpha = 0.5, Viterbi detection on

4FSK

Sensitivity at 4.8 kbps −112 dBm fDEV (inner)2= 1.2 kHz, high sensitivity mode, IFBW = 13.5

kHz

Raised Cosine 4FSK

Sensitivity at 4.8 kbps −109 dBm fDEV (inner)2= 1.2 kHz, high sensitivity mode, IFBW = 13.5 kHz,

alpha = 0.5

INPUT IP3 Two-tone test, fLO = 860 MHz, f1 = fLO + 100 kHz,

f2 = fLO − 800 kHz

Low Gain, Enhanced Linearity

Mode

−3 dBm LNA_GAIN = 3, MIXER_LINEARITY = 1

Medium Gain Mode −13.5 dBm LNA_GAIN = 10, MIXER_LINEARITY = 0

High Sensitivity Mode −24 dBm LNA_GAIN = 30, MIXER_LINEARITY = 0

ADJACENT CHANNEL REJECTION

(ACR)

868 MHz Desired signal is 3 dB above the sensitivity point of

−109.5 dBm as per EN 300 220; rejection is measured as the

level of an unmodulated interferer to cause a BER of 10−2 for

the desired signal

12.5 kHz Channel Spacing −60 dBm IFBW = 9 kHz, data rate = 0.25 kbps, fDEV = 1 kHz, LBW = 6 kHz

25 kHz Channel Spacing −39 dBm IFBW = 9 kHz, data rate = 0.25 kbps, fDEV = 1 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −60 dBm IFBW = 9 kHz, data rate = 1 kbps, fDEV = 1 kHz, LBW = 6 kHz

25 kHz Channel Spacing −40 dBm IFBW = 9 kHz, data rate = 1 kbps, fDEV = 1 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −59.5 dBm IFBW = 9 kHz, data rate = 2.4 kbps, fDEV = 1.2 kHz, LBW = 6 kHz

25 kHz Channel Spacing −42 dBm IFBW = 9 kHz, data rate = 2.4 kbps, fDEV = 1.2 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −63 dBm IFBW = 9 kHz, data rate = 4.8 kbps, fDEV = 2.4 kHz, LBW = 6 kHz

25 kHz Channel Spacing −45 dBm IFBW = 9 kHz, data rate = 4.8 kbps, fDEV = 2.4 kHz, LBW = 6 kHz

25 kHz Channel Spacing −57 dBm IFBW = 18.5 kHz, data rate = 9.6 kbps, fDEV = 4.8 kHz, LBW = 6 kHz

460 MHz Desired signal is at −106.5 dBm; rejection is measured as the

level of an unmodulated interferer to cause a BER of 10−2 for

the desired signal

12.5 kHz Channel Spacing −59.5 dBm IFBW = 9 kHz, data rate = 0.25 kbps, fDEV = 1 kHz, LBW = 6 kHz

25 kHz Channel Spacing −37.5 dBm IFBW = 9 kHz, data rate = 0.25 kbps, fDEV = 1 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −60 dBm IFBW = 9 kHz, data rate = 1 kbps, fDEV = 1 kHz, LBW = 6 kHz

25 kHz Channel Spacing −41 dBm IFBW = 9 kHz, data rate = 1 kbps, fDEV = 1 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −62 dBm IFBW = 9 kHz, data rate = 2.4 kbps, fDEV = 1.2 kHz, LBW = 6 kHz

25 kHz Channel Spacing −43 dBm IFBW = 9 kHz, data rate = 2.4 kbps, fDEV = 1.2 kHz, LBW = 6 kHz

12.5 kHz Channel Spacing −61.5 dBm IFBW = 9 kHz, data rate = 4.8 kbps, fDEV = 2.4 kHz, LBW = 6 kHz

25 kHz Channel Spacing −44.5 dBm IFBW = 9 kHz, data rate = 4.8 kbps, fDEV = 2.4 kHz, LBW = 6 kHz

25 kHz Channel Spacing −56 dBm IFBW = 18.5 kHz, data rate = 9.6 kbps, fDEV = 4.8 kHz, LBW = 6 kHz

COCHANNEL REJECTION Desired signal is 3 dB above the sensitivity point of

−109.5 dBm; rejection is measured as the level of an

interferer to cause a BER of 10−2 for the desired signal

868 MHz −5 dB IFBW = 9 kHz, data rate = 4.8 kbps, fDEV = 2.4 kHz, LBW = 6 kHz

ADF7021-V

Rev. 0 | Page 8 of 60

Parameter Min Typ Max Unit Test Conditions/Comments

IMAGE CHANNEL REJECTION Desired signal (2FSK, 9.6 kbps, ±4 kHz deviation) is 3 dB

above the sensitivity point (BER = 10−2); modulated inter-

ferer (2FSK, 9.6 kbps, ±4 kHz deviation) is placed at the

image frequency of fRF − 200 kHz; the interferer level is

increased until BER = 10−2

868 MHz 26/39 dB Uncalibrated/calibrated,3VDD = 3.0 V, TA= 25°C

460 MHz 29/50 dB Uncalibrated/calibrated,3VDD = 3.0 V, TA= 25°C

BLOCKING

Desired signal is 3 dB above the sensitivity point of

−109.5 dBm; rejection is measured as the level of an

unmodulated interferer to cause a BER of 10−2 for the

desired signal; as per ETSI EN 300 220-1

±1 MHz −29.5 dBm

±2 MHz −26.5 dBm

±5 MHz −26 dBm

±10 MHz −25.5 dBm

SATURATION (MAXIMUM

INPUT LEVEL)

12 dBm 2FSK mode, BER = 10−3

RECEIVED SIGNAL STRENGTH

INDICATION (RSSI)

Input Power Range4−120 to −47 dBm

Linearity ±2 dB Input power range = −100 dBm to −47 dBm

Absolute Accuracy ±3 dB Input power range = −100 dBm to −47 dBm

Response Time 333 μs As per AGC gain stage, AGC clock = 3 kHz

AUTOMATIC FREQUENCY LOOP

(AFC)

Pull-In Range, Minimum 0.5 kHz Range is programmable in Register 10 (Bits[DB31:DB24])

Pull-In Range, Maximum 1.5 × IF_

FILTER_BW

kHz Range is programmable in Register 10 (Bits[DB31:DB24])

Response Time 96 Bits Dependent on modulation index

Accuracy 0.5 kHz Input power range = −100 dBm to +12 dBm

Rx SPURIOUS EMISSIONS5

External 920 MHz VCO −54/−88 dBm <1 GHz at antenna input, unfiltered conductive/filtered

conductive

External 920 MHz VCO −45/−66 dBm >1 GHz at antenna input, unfiltered conductive/filtered

conductive

External 1738 MHz VCO −85/−85 dBm <1 GHz at antenna input, unfiltered conductive/filtered

conductive

External 1738 MHz VCO −39/−52 dBm >1 GHz at antenna input, unfiltered conductive/filtered

conductive

LNA INPUT IMPEDANCE RFIN to RFGND; refer to the AN-859 Application Note for

other frequencies

fRF = 915 MHz 24 − j60 Ω

fRF = 868 MHz 26 − j63 Ω

fRF = 470 MHz 58 − j124 Ω

fRF = 450 MHz 63 − j129 Ω

fRF = 426 MHz 68 − j134 Ω

fRF = 315 MHz 96 − j160 Ω

fRF = 175 MHz 178 − j190 Ω

fRF = 169 MHz 182.5 − j194 Ω

1Using Gaussian or raised cosine filtering. The frequency deviation should be chosen to ensure that the transmit-occupied signal bandwidth is within the receiver

IF filter bandwidth.

24FSK fDEV is defined as the frequency spacing from the RF carrier to +fDEV or −fDEV. It is also equal to half the frequency spacing between adjacent symbols.

3Calibration of the image rejection used an external RF source.

4For received signal levels < −100 dBm, it is recommended that the RSSI readback value be averaged over a number of samples to improve RSSI accuracy at low input power.

5Filtered conductive receive spurious emissions are measured on the EVAL-ADF7021-VDBxZ, which includes a T-stage harmonic filter (two inductors and one capacitor).

ADF7021-V

Rev. 0 | Page 9 of 60

DIGITAL SPECIFICATIONS

Table 4.

Parameter Min Typ Max Unit Test Conditions/Comments

TIMING INFORMATION

Chip Enabled to Regulator

Ready

50 μs CREG[1:4] = 100 nF

Chip Enabled to Tx Mode 32-bit register write time = 50 μs

TCXO Reference 1 ms Depends on VCO settling

XTAL 2 ms Depends on VCO settling

Chip Enabled to Rx Mode 32-bit register write time = 50 μs, IF filter coarse

calibration only

TCXO Reference 1.2 ms Depends on VCO settling

XTAL 2.2 ms Depends on VCO settling

Tx-to-Rx Turnaround Time AGC settling +

(5 × tBIT)

Time to synchronized data output; includes AGC

settling (three AGC levels) and CDR synchronization;

tBIT = data bit period; AFC settling not included

LOGIC INPUTS

Input High Voltage, VINH 0.7 × VDD V

Input Low Voltage, VINL 0.2 × VDD V

Input Current, IINH/IINL ±1 μA

Input Capacitance, CIN 10 pF

Control Clock Input 50 MHz

LOGIC OUTPUTS

Output High Voltage, VOH VDD2 − 0.4 V IOH = 500 μA

Output Low Voltage, VOL 0.4 V IOL = 500 μA

CLKOUT Rise/Fall Time 5 ns

CLKOUT Load 10 pF

ADF7021-V

Rev. 0 | Page 10 of 60

GENERAL SPECIFICATIONS

Table 5.

Parameter Min Typ Max Unit Test Conditions/Comments

TEMPERATURE RANGE (TA) −40 +85 °C

POWER SUPPLIES

Voltage Supply, VDD 2.3 3.6 V All VDDx pins must be tied together

TRANSMIT CURRENT CONSUMPTION1, 2V

DD = 3.0 V, PA is matched into 50 Ω

868 MHz

0 dBm 17.6 mA

5 dBm 20.8 mA

10 dBm 27.1 mA

460 MHz

0 dBm 13.8 mA

5 dBm 17 mA

10 dBm 23 mA

RECEIVE CURRENT CONSUMPTION2

DD = 3.0 V

868 MHz

Low Current Mode 19.3 mA

High Sensitivity Mode 21.7 mA

460 MHz

Low Current Mode 16.3 mA

High Sensitivity Mode 18.3 mA

POWER-DOWN CURRENT CONSUMPTION2

Low Power Sleep Mode 0.1 1 μA CE low

1The transmit current consumption tests used the same combined PA and LNA matching network as that used on the EVAL-ADF7021-VDBxZ evaluation boards.

Improved PA efficiency is achieved by using a separate PA matching network.

2Device current only. VCO and TCXO currents are excluded.

TIMING CHARACTERISTICS

VDD = 3 V ± 10%, GND = 0 V, TA= 25°C, unless otherwise noted. Guaranteed by design but not production tested.

Table 6.

Parameter Limit at TMIN to TMAX Unit Description

t1>10 ns SDATA to SCLK setup time

t2>10 ns SDATA to SCLK hold time

t3>25 ns SCLK high duration

t4>25 ns SCLK low duration

t5>10 ns SCLK to SLE setup time

t6>20 ns SLE pulse width

t8<25 ns SCLK to SREAD data valid, readback

t9<25 ns SREAD hold time after SCLK, readback

t10 >10 ns SCLK to SLE disable time, readback

t11 5 < t11 < (¼ × tBIT) ns TxRxCLK negative edge to SLE

t12 >5 ns TxRxDATA to TxRxCLK setup time (Tx mode)

t13 >5 ns TxRxCLK to TxRxDATA hold time (Tx mode)

t14 5 < t14 < (¼ × tBIT) μs TxRxCLK negative edge to SLE

t15 >¼ × tBIT μs SLE positive edge to positive edge of TxRxCLK (Rx mode)

Table des matières

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