Agilent Technologies DSOX4USBSQ USB 2.0 Manuel utilisateur

DSOX4USBSQ USB 2.0

Signal Quality Analysis

Application

Electrical Testing Notes

Notices

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Manual Part Number

Version 03.10.0000

Edition

February 12, 2013

Available in electronic format only

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DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 3

USB 2.0 Signal Analysis—At a Glance

The DSOX4USBSQ USB 2.0 Signal Quality Analysis application for the

InfiniiVision 4000 X- Series oscilloscopes supports two use models:

•You can quickly test USB signal quality in- circuit with real- world

packets. In this case:

•You can use test fixtures as an easy way to probe signals.

•The USBSQ analysis application's Auto Setups may need to be

adjusted before analyzing real- world packets.

•You can verify signal quality to USB 2.0 compliance specifications. In

this case:

•You must use the test fixtures, equipment, and test setups required

by the USB Implementers Forum (USB- IF).

•The USBSQ analysis application's Auto Setups should work as is for

the required test packets.

The signal quality analysis application:

•Lets you select Hi- Speed, Full Speed, or Low Speed tests for Devices

and Hosts. Hubs can be tested by running both device and hosts tests

against the hub.

•Runs all the signal quality tests for the selected speed and device type

combination.

•Automatically sets up the oscilloscope for the selected tests.

•Provides detailed results information for each test that has been run.

•Lets you save the detailed results information to an HTML report.

In This Book This manual contains notes on the electrical tests that are performed by

the DSOX4USBSQ USB 2.0 Signal Quality Analysis application; it describes

the equipment used and how the tests are performed. It has these

chapters:

•Chapter 1, “Preparing for Signal Quality Analysis,” starting on page 7

•Chapter 2, “Device Signal Quality Testing,” starting on page 19

•Chapter 3, “Host Signal Quality Testing,” starting on page 39

•Chapter 4, “Hub Upstream Signal Quality Testing,” starting on page 53

•Chapter 5, “Hub Downstream Signal Quality Testing,” starting on page

•Chapter 6, “Saving Test Results to an HTML File,” starting on page 81

•Appendix A, “Probing Hi-Speed Signals with InfiniiMode Using SQiDD

as a Feedthrough,” starting on page 83

See Also •The USB 2.0 developers documents are available at the USB

Implementers Forum web site, "http://www.usb.org/developers/docs".

4 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes

DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 5

Contents

USB 2.0 Signal Analysis—At a Glance 3

1 Preparing for Signal Quality Analysis

Oscilloscope Requirements 8

Fixtures for Signal Quality Tests 9

Fixtures for Hi-Speed Signal Quality Tests 9

Fixture for Full/Low Speed Signal Quality Tests 10

Probe Requirements 12

Differential Probe Connection for Hi-Speed Signal Quality Tests 12

Single-Ended SMA Cable Connection for Hi-Speed Signal Quality Tests 13

Single-Ended Probe Connection for Full/Low Speed Signal Quality Tests 14

Miscellaneous Cables and Devices 15

Additional Equipment and Set Up for Signal Quality Compliance Testing 16

High-Speed Electrical Test Bed Computer 16

Additional Set Up for Signal Quality Compliance Testing 17

2 Device Signal Quality Testing

Device Hi-Speed Signal Quality Test 20

Device Hi-Speed Connection - Differential Probe 24

Device Hi-Speed Connection - SMA Cables 25

Device Hi-Speed Compliance Test Packets 26

Device Full Speed Signal Quality Test 28

Device Full Speed Connection 30

Device Full Speed Compliance Test Packets 31

Device Low Speed Signal Quality Test 33

Device Low Speed Connection 35

Device Low Speed Compliance Test Packets 36

3 Host Signal Quality Testing

Host Hi-Speed Signal Quality Test 40

Host Hi-Speed Connection - Differential Probe 43

Host Hi-Speed Connection - SMA Cables 44

Host Hi-Speed Compliance Test Packets 44

6 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes

Host Full Speed Signal Quality Test 46

Host Full Speed Connection 48

Host Low Speed Signal Quality Test 50

Host Low Speed Connection 52

4 Hub Upstream Signal Quality Testing

Hub Upstream Hi-Speed Signal Quality Test 54

Hub Upstream Hi-Speed Connection - Differential Probe 57

Hub Upstream Hi-Speed Connection - SMA Cables 58

Hub Upstream Hi-Speed Compliance Test Packets 59

Hub Upstream Full Speed Signal Quality Test 60

Hub Upstream Full Speed Connection 62

Hub Upstream Full Speed Compliance Test Packets 63

5 Hub Downstream Signal Quality Testing

Hub Downstream Hi-Speed Signal Quality Test 66

Hub Downstream Hi-Speed Connection - Differential Probe 69

Hub Downstream Hi-Speed Connection - SMA Cables 70

Hub Downstream Hi-Speed Compliance Test Packets 71

Hub Downstream Full Speed Signal Quality Test 72

Hub Downstream Full Speed Connection 74

Hub Downstream Low Speed Signal Quality Test 76

Hub Downstream Low Speed Connection 78

6 Saving Test Results to an HTML File

A Probing Hi-Speed Signals with InfiniiMode Using SQiDD as a Feedthrough

Index

s17

DSOX4USBSQ USB 2.0 Signal Quality Analysis Application

Electrical Testing Notes

Preparing for Signal Quality Analysis

Oscilloscope Requirements 8

Fixtures for Signal Quality Tests 9

Probe Requirements 12

Miscellaneous Cables and Devices 15

This chapter describes the equipment and software required for

performing signal quality analysis with the 4000 X- Series oscilloscope and

the DSOX4USBSQ USB 2.0 Signal Quality Analysis application.

8 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes

1Preparing for Signal Quality Analysis

Oscilloscope Requirements

The DSOX4USBSQ USB 2.0 Signal Quality Analysis application requires an

Agilent InfiniiVision 4000 X-Series oscilloscope, firmware version 3.10 or

later.

For Hi-Speed

Tests

Hi- Speed tests require a 1.5 GHz bandwidth model oscilloscope.

Hi- Speed tests on a 2- channel oscilloscope with single- ended SMA cable

connections is not supported because the sample rate will not meet the

5 GSa/s rate that is required. Using a differential probe on a 2- channel

oscilloscope works fine.

For Full and Low

Speed Tests

Full and Low Speed tests can be performed with 200 MHz, 350 MHz,

500 MHz, 1 GHz, or 1.5 GHz bandwidth model oscilloscopes.

Full Speed testing is best on a 4- channel oscilloscope because when using

a 2- channel oscilloscope, channels 1 and 2 are non- interleaved and the

sample rate will be below the 4 GSa/s that the USB- IF testing procedures

require. If Full Speed tests are run on a 2- channel oscilloscope,

interpolation is used on the data.

For Optional USB

2.0 Triggering and

Decode in the

Oscilloscope

The optional DSOX4USBH and DSOX4USBFL products (for USB 2.0

Hi- Speed and Full/Low- Speed triggering and decode, respectively) can be

very useful tools for identifying and triggering on packets that you might

want to run the USB signal quality tests on.

Preparing for Signal Quality Analysis 1

DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes 9

Fixtures for Signal Quality Tests

Two different fixtures are used for Hi- Speed tests; one is for devices and

other is for hosts. See “Fixtures for Hi- Speed Signal Quality Tests" on

page 9.

One fixture is used for Full and Low Speed tests. See “Fixture for

Full/Low Speed Signal Quality Tests" on page 10.

Fixtures for Hi-Speed Signal Quality Tests

Hi- Speed testing requires one of these test fixtures:

•Device Hi- Speed Signal Quality Test Fixture, part number E2649- 66401.

This fixture can be ordered using the Agilent part number

E2649- 60001, which includes two RF SMA (m) vertical 50- ohm

termination connectors and two 4 inch USB A- to- B cables

(E2646- 61601).

•Host Hi- Speed Signal Quality Test Fixture, part number E2649- 66402.

10 DSOX4USBSQ USB 2.0 Signal Quality Analysis Application Electrical Testing Notes

1Preparing for Signal Quality Analysis

This fixture can be ordered using the Agilent part number

E2649- 60002, which includes two RF SMA (m) vertical 50- ohm

termination connectors and two 4 inch USB A- to- B cables

(E2646- 61601).

These Hi-Speed Signal Quality test fixtures are powered by a 5 V power

supply, which can be ordered using Agilent part number 0950- 2546.

Equivalent power supplies can also be used.

Older Versions of

the Hi-Speed

Signal Quality

Test Fixtures

Older versions of the Hi- Speed signal quality test fixtures exist and may

be used:

•Device Hi- Speed Signal Quality Test Fixture, part number E2645- 66507.

•Host Hi- Speed Signal Quality Test Fixture, part number E2645- 66508.

When using these older fixtures with the 1131A, 1133A, or 1134A

InfiniiMax differential probes, you also need the Agilent header adapter,

part number 01131- 68703. This header adapter is included with E2669A

and E2678A (purchased after October 2003).

Fixture for Full/Low Speed Signal Quality Tests

Full and Low Speed testing require this test fixture:

•E2646A/B SQiDD board test fixture.

NOTE

The Hi-Speed fixture part numbers E2649-66401 and E2649-66402 are provided for

identification purposes only and cannot be used for ordering.

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