GigaDevice Semiconductor GD32 Series Instructions d'installation et d'utilisation

GigaDevice Semiconductor Inc.

GD32 MCU Power Consumption

Testing Process

Application Note

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GD32  MCU  Power  Consumption  Testing  Process 
1
 
Table of Contents 
Table of Contents ...........................................................................................................1
List of Figures ................................................................................................................2
List of Tables ..................................................................................................................3
1. Introduction..............................................................................................................4
2. Power consumption testing process.....................................................................5
2.1. Preparation of test tools .............................................................................................................. 5
2.2. Power consumption testing setting ........................................................................................... 5
2.3. Testing process ............................................................................................................................ 6
2.4. General Problems......................................................................................................................... 7
2.5. Case description .......................................................................................................................... 8
3. Summary ..................................................................................................................9
4. Revision history.....................................................................................................10 
 
 

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GD32 MCU Power Consumption Testing Process

List of Figures

Figure 2-1. Schematic diagram of hardware connection for test.................................................... 6

Figure 2-2. Hardware cable connections for Battery supply test ................................................... 7

Figure 2-3. Power consumption characteristic................................................................................. 8

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GD32 MCU Power Consumption Testing Process

List of Tables

Table 4-1. Revision history ............................................................................................................... 10

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GD32 MCU Power Consumption Testing Process

1. Introduction

This article is designed for GD32 MCU, mainly introduces the power testing process, including

the selection and use of test instrument specifications, hardware circuit design, software code

use, test data recording, so as to achieve accurate power data.

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GD32 MCU Power Consumption Testing Process

2. Power consumption testing process

2.1. Preparation of test tools

MCU power consumption testing generally requires the following tools:

1. MCU chip to be tested. In general, at least three samples of the same batch and process

of MCU should be taken as the tested objects. After getting the chip, check whether the silk

screen is clear on the surface of the chip package, and the pin is clean and has no sign of

bending damage.

2. Minimum system board, only the power supply, crystal input pin, reset, download port,

BOOT pin, to avoid the influence of external excess circuit current consumption.

3. Multimeter used to measure the input current of the MCU under test. A multimeter with at

least four and a half digits should be used. If possible, a multimeter with a higher digit should

be used to ensure accurate and reliable test data. During the test, connect the pen of the

multimeter in the way of current measurement and set the gear to DC current.

4. Signal source used to provide an external active clock for the MCU under test under some

test requirements. The recommended signal source is an instrument with a frequency of

30MHz, a resolution of 16 bits, and a sampling rate of 250MSa / s or higher.

5. Dc digital power supply, according to test requirements to adjust the output use.

6. J-Link, use to test code download.

2.2. Power consumption testing setting

Hardware configuration

According to the comprehensive consideration of user performance and power consumption,

refer to the chapter of clock tree in user manual and power consumption with datasheet, select

the appropriate power supply voltage and crystal oscillator input, and configure the clock

source as the required master frequency by operating the frequency divider and frequency

multiplier to set the clock source to the desired primary frequency.

Select an appropriate stabilizing voltage source according to the specific product, and adjust

the voltage value to 3.3V / 5V. Most of the products use 3.3V power supply, some of the car

gauge chips use 5V power supply compatible with 3.3V. The crystal oscillator input supports

passive crystal oscillator and active crystal oscillator. Select the appropriate crystal oscillator

by referring to the crystal oscillator input range specified in the clock tree of the user manual

of the chip. When the external crystal does not meet the test conditions, the signal source can

be used as the HXTAL input to facilitate the test, and the MCU enables BYPASS MODE.

Signal source output requirements: high resistance output, square wave, duty cycle 50%,

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GD32 MCU Power Consumption Testing Process

frequency 4MHz / 2MHz, VPP=3.3V, OFFSET=1.65V.

Software configuration

Peripheral enabled / disabled. The software developer turns on / off the relevant peripheral

clock by manipulating library functions in the code according to the user manual.

I / O port configuration. Before entering low power mode, all spare I / O pins need to be

configured as analog inputs. It should be noted that the minimum package is configured as

the maximum package pins, even if these pins are not drawn in the package. Before

configuring pins, you are advised to add a wait time to the code to prevent the debugging port

from being disabled.

Low power mode selection. Select the required low power mode according to the

configuration code in the power consumption section of the datasheet. After entering the low

power mode, the power consumption is close to that of the datasheet.

2.3. Testing process

The hardware and software test conditions of each mode are different. After understanding

the basic requirements of each mode, you can perform the test in the following sequence to

simplify the process, save time and cost, and reduce the loss of hardware insertion and

removal.

Build hardware framework

Select appropriate power supply, external crystal / signal source, and configure BOOT pins to

form the MCU minimum system. The actual power consumption of "IVDD+IVDDA" under different

power consumption modes can be tested by connecting the ammeter in series in the minimum

system of power supply and MCU according to the power consumption section of the

datasheet, as shown in Figure 2-1. Schematic diagram of hardware connection for test.

Figure 2-1. Schematic diagram of hardware connection for test

MCU minimum

system

VDD

VDDA

GND

VOUT GND

+ -

Power

supply

As shown in Figure 2-2. Hardware cable connections for Battery supply test, when MCU

VDD is disconnected, its VBAT pin can be connected to backup source power supply such as

battery or other power supply. MCU Battery supply has four modes: LXTAL High driving,

LXTAL Medium High driving, LXTAL Medium Low driving, LXTAL Low driving. The test is to

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GD32 MCU Power Consumption Testing Process

separately test the input current of the VBAT pin in each mode of Battery supply when the

MCU VDD is disconnected. Generally, the common VBAT supply voltage is 3.6V, 3.3V, 2.6V,

1.8V. According to the four modes, it is divided into four codes. Each code is directly compiled

and downloaded, and tested and recorded by changing different power supply voltages.

Figure 2-2. Hardware cable connections for Battery supply test

MCU minimum

system

VDD

VDDA

GND

VOUT GND

+ -

Power

supply

VBAT

Download code

The test is generally configured by the software writer, and the code is written according to

the requirements of the corresponding power mode in the data manual. If there are special

values of clock frequency and power supply voltage, the test conditions need to be set

separately. Download the code into MCU.

Power consumption reading

Separate the minimum system board from the debugging tool. Turn off and restart the power

supply to generate a power-on reset and disable the internal debug circuit. Test the

corresponding power consumption and wait for the ammeter to stabilize before recording data.

2.4. General Problems

Code download exception

"No Cortex-M SW Device Found" is displayed. Check whether all the connections are correct

and whether there is bad contact; Check that the download port is configured to Analog input.

If the first download is normal and the second download is abnormal, check whether the

system clock Settings and waiting time are correct. If the Settings are not correct, the

download port will be configured as an analog input mode after the program is downloaded

for the first time, making the MCU no longer recognized and unable to perform subsequent

downloads. At this point, we need to put MCU into ISP mode and erase flash. Reset the code

and download.

The message "Cannot Load Flash Device Description" is displayed. Check whether the

Options for Target of Keil has installed the PACK package and whether the MCU model is

selected; All wiring is correct, there is no forget jumper, poor contact and other situations.

The message "Cannot Load Flash Programing Algorithm" is displayed. Whether the correct

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GD32 MCU Power Consumption Testing Process

Flash Size is added to Programing Algorithm in the Debug-Flash Download and whether the

RAM for Algorithm is set correctly.

Data deviation

Each test will have a reference value. When the measurement contrast deviation is large, the

following checks can be done: Check whether the hardware test system is connected to other

wire paths, resulting in system leakage; It is necessary to identify the source of reference

values to determine whether power consumption differences are caused by power

consumption reduction or function adjustment and improvement. Determine if the code is

written to meet the power test requirements, such as whether the GPIO is configured to

analog input state, whether all peripherals are enabled or disabled, whether the register is

configured successfully, and whether the system clock is configured correctly; Check whether

the system clock is set correctly. You can first check whether the code parameters are

correctly configured, and then use PA8 to output the system clock and use oscilloscope to

observe the running clock frequency.

2.5. Case description

Take GD32F303 series as an example, as shown in Figure 2-3. Power consumption

characteristic. power consumption characteristics are configured according to the test

conditions in the datasheet. Under Deepsleep mode, MCU is selected to supply 3.3V power,

external crystal oscillator is selected as 8MHz passive crystal oscillator, system clock is set

as 120MHz, and LDO is set in lower power mode. Turn off IRC40K, turn off RTC, and

configure all GPIOs in analog input mode. At 25°C, the Deepsleep mode power range of the

minimum system on the chip should be between 159.8uA and 1100uA.

Figure 2-3. Power consumption characteristic

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GD32 MCU Power Consumption Testing Process

3. Summary

According to the measured application time and current consumption of each MCU mode, the

average current consumption can be estimated in the actual application program, so that

users can calculate the sustainable working time of MCU under the condition of battery power.

In general, the test result under the standard testing process is close to the value of the

datasheet, but considering the individual difference of the chip and the update of the chip

version, the actual data may be inconsistent with the datasheet.

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