Description
The SET-1240 xVDT Emulator Card provides 8 independent xVDT emulator channels, with galvanic
isolated I/O. By this the applied excitation voltage and frequency can vary from channel to channel. Each
channel can be configured individually as 6-wire or 4/5-wire xVDT emulation.
The SET-1240 xVDT Emulator Card works with a wide excitation frequency range of 400 Hz to 10 kHz.
The emulated A and B signals can be controlled separately. This allows the SET-1240 xVDT Emulator
Card to emulate resolvers. In 5 and 6 wire configuration this also makes the simulation of over and
undervoltage faults of the A + B current sum signal possible.
The SET-1240 xVDT Emulator Card has several self-test features. One of them allows the use an
excitation signal injected by the instrumentation bus of the RTI, instead of the excitation signals from
the front I/O: The RTI excitation can be used for both, self-test, and normal operation.
The self-test excitation generation circuit of the SET-1240 xVDT Emulator Card can generate a 400 Hz, 1
kHz, and 10 kHz excitation signal. Either this signal or the RTI excitation can be selected as test excitation.
As test CNTL signal 0 V and ±10 V ±2% can be selected, which represents a gain of 0 and 1 ±2%.
Instead of passing the A and B signals to the Front I/O, they can be switched to the internal test bus
(Test_A+, Test_B+ and Test_AB-). The internal test bus can be forwarded either to the Self-test
Evaluation circuit or to the instrumentation bus of the RTI. This includes the selection of either Test_A+
or Test_B+ as Test_AB+ signal.
The transformers used for the galvanic isolation are mounted on an internal sub-card and can be easily
replaced. Please contact the SET sales department if you require a customized transformer module.
