SanDisk CompactFlash 5000 Manuel utilisateur

FCC Class B Test Report

For A Class B Digital Device

Client:

SanDisk Corporation

7 Atir Yeda Street

Kfar Saba, Israel

Phone 972-9-7644908

Device Under Test:

SanDisk SSD SATA 5000 2.5”

Document Number: 2007160

Reference Number: QRTL07-033

This report may not be reproduced, except in full, without the written approval of Rhein Tech Laboratories, Inc.

Test Overview:

Model No.: SanDisk SSD SATA 5000 2.5”

Manufacturer’s

Name: SanDisk Corporation

Manufacturer’s

Address: 7 Atir Yeda Street

Kfar Saba, Israel

Manufacturer’s

Contact: Eitan Chalfon

Type of Equipment: ITE

Serial No.: 713050010

Year of Manufacture: 2007

Location of Testing: Rhein Tech Laboratories, Inc., Herndon, VA

Date of Receipt: February 5, 2007

Date(s) of Testing: April 10, 2007

Purpose of Testing: FCC Class B Compliance

Standard(s) to which device was tested:

STANDARDS SPECIFIC TESTS

APPLICABILITY

Tested

Not Tested

CFR47 Parts 15.109 and

15.107 Radiated and Conducted Emissions

Test Engineer: Jon Wilson Signature:

Report Written By: Jon Wilson Signature:

Report Approved By: Desmond Fraser Signature:

Report Number: 2007160

Report Date: April 27, 2007

®Accredited by the National Voluntary Accreditation Program for the specific scope of accreditation under

Lab Code 20061-0.

Note: This report may not be used by the client to claim product endorsement by NVLAP or any agency of the U.S. Government.

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 3 of 17

DoC Report

2006137

04/27/07

TABLE OF CONTENTS

1GENERAL INFORMATION.............................................................................................................................4

1.1 DEVIATIONS................................................................................................................................................4

1.2 ACCREDITATION STATEMENTS .....................................................................................................................4

2TEST DETAILS................................................................................................................................................5

2.1 PRODUCT DESCRIPTION ..............................................................................................................................5

2.2 MODIFICATIONS...........................................................................................................................................5

2.3 EUT EXERCISE DESCRIPTION......................................................................................................................5

2.4 EQUIPMENT UNDER TEST ............................................................................................................................6

2.5 CONFIGURATION OF TESTED SYSTEM...........................................................................................................7

3PRODUCT LABELLING/ INFORMATION TO THE USER.............................................................................8

3.1 DOCLABEL ON DEVICE...............................................................................................................................8

3.2 DOCSTATEMENT IN USER’S MANUAL...........................................................................................................8

3.3 LOCATION OF LABEL ON EUT.......................................................................................................................8

4CONDUCTED EMISSIONS.............................................................................................................................9

4.1 SITE AND TEST DESCRIPTION.......................................................................................................................9

4.2 CONDUCTED EMISSIONS TEST DATA..........................................................................................................10

4.3 CONDUCTED TEST PHOTOGRAPHS.............................................................................................................11

5RADIATED EMISSIONS................................................................................................................................12

5.1 SITE AND TEST DESCRIPTION.....................................................................................................................12

5.2 FIELD STRENGTH CALCULATION.................................................................................................................13

5.3 RADIATED EMISSIONS TEST DATA..............................................................................................................14

5.4 RADIATED TEST PHOTOGRAPHS ................................................................................................................15

6EMISSIONS EQUIPMENT LIST....................................................................................................................16

7MANUFACTURER’S EQUIPMENT FILE CHECKLIST (PER FCC RULES §2.1075)..................................17

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 4 of 17

DoC Report

2006137

04/27/07

1 GENERAL INFORMATION

The following test report for a Class B digital device is prepared on behalf of SanDisk Corporation in

accordance with Part 2, and Part 15, Subparts A and B of the Federal Communications Commissions Rules and

Regulations. The Equipment Under Test (EUT) was the SanDisk SSD SATA 5000 2.5”. The test results

reported in this document relate only to the items that were tested.

All measurements contained in this Application were conducted in accordance with ANSI C63.4 Methods of

Measurement of Radio Noise Emissions, 2003. The instrumentation utilized for the measurements conforms to

the ANSI C63.4 standard for EMI and Field Strength Instrumentation. Some accessories are used to increase

sensitivity and prevent overloading of the measuring instrument. Calibration checks are performed regularly on

all test equipment.

All radiated and conducted emission measurements were performed manually at Rhein Tech Laboratories, Inc.

The radiated emissions measurements were performed on the (three/ten) meter, open field, test range

maintained by Rhein Tech Laboratories, Inc., 360 Herndon Parkway, Suite 1400, Herndon, Va., 20170.

Complete description and site attenuation measurement data has been placed on file with the Federal

Communications Commission. The power line conducted emission measurements were performed in a

shielded enclosure also located at the Herndon, Virginia facility. Rhein Tech Laboratories is accepted by the

FCC as a facility available to do measurement work for others on a contract basis.

1.1 DEVIATIONS

There were no deviations from the test standard(s) and/or methods.

1.2 ACCREDITATION STATEMENTS

•NVLAP (USA): Accreditation under NVLAP Lab Code: 200061-0

•US CAB: Recognition as of U.S. Conformity Assessment Body (CAB) for EMC testing under US-EU and

US-APEC MRA; IC accepted CAB under Phase I of APEC Telecommunication MRA. Identification

number US0079.

•FCC (USA): Listing of test sites, Registration # 90902

•IC (Canada): Listing of test sites, IC 2956-1 and IC 2956-2

•US TCB (ATCB): Certification of cooperation, granted in 2005

•CE Notified Body: Rhein Tech Laboratories, Inc. has been approved by TNO Certification B.V. to provide

EMC Test Reports and Technical Construction Files to TNO Certification B.V. Rheintech Certification

number: 10118957

•AUSTEL (Australia): Acceptance as of a Listed Test House, A97/TH/0107

•ANATEL (Brazil, telecommunication): NCC certification for performing tests

•Ministry of Commerce (New Zealand): Approval of a test laboratory: ECR 3-9 BAE

•VCCI (Japan): Approval and registration of RTL test sites as R-1113 and C-1172

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 5 of 17

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2 TEST DETAILS

2.1 PRODUCT DESCRIPTION

SanDisk SATA 5000 2.5” SSD is a drop-in replacement for the hard disk drive. It has no moving/ mechanical

parts.

Features

o 2.5" small form factor supporting unformatted capacity of 32GB

o 9.5mm case height

o SATA 7+15 pins combo connector

Interface to host

o Standards: SATA 1.0a 1.5Gb/s

High performance

o Host transfer rate: 150MB/s

o Internal transfer read rate: 67MB/s

o Internal transfer write rate: 47MB/s

o Random Read (4KB): 5350 IOPS

o Average access time: 0.11msec

Low power consumption

o Supply voltage: 5Vdc

o Typical read/write: 190mA

o Typical idle: 125mA

o Typical standby: 70mA

o Typical sleep: 60mA

Reliability

o Mean time between failure (MTBF): 2,000,000 hours, based on Part Stress Analysis

o Operating shock: 1,500G, 0.5msec half sine

o Operating vibration: 2.17G, 7-500 Hz

o Operating temperature: 0˚C to 70˚C

o Non operating temperature and storage: -55˚C to 95˚C

o Operating temperature: 0˚C to 70˚C

2.2 MODIFICATIONS

None

2.3 EUT EXERCISE DESCRIPTION

The SanDisk SSD SATA 5000 2.5” was installed in a Class B laptop personal computer which was running

Windows XP. The computer was programmed to transfer files continuously, to and from the device under test

using a software application provided by Dell. The SanDisk SSD SATA 5000 2.5” was tested as a

representative of the full line of available capacities. The only difference among the different sizes is the on-

board flash memory. Otherwise, there are no physical, clock, or electronic changes. Determination of the 2.5

as the “worst case” test sample was determined by SanDisk based on preliminary scanning of the devices under

test and engineering judgement that: because of the small changes between the various capacities, any

changes in emission amplitudes or EMC susceptibility would be inconsequential.

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 6 of 17

DoC Report

2006137

04/27/07

2.4 EQUIPMENT UNDER TEST

Listed below are the identifiers and descriptions of all equipment, cables, and internal devices used with the EUT for this test.

Equipment Under Test

Part Manufacturer Model Serial

Number FCC

ID Cable

Description RTL

Bar

Code

Equipment

Arrival

Date

SATA Storage

Device SanDisk

Corporation SanDisk SSD

SATA 5000 2.5” 713050010 DoC Internal N/A 4/10/2007

Auxiliary Equipment

Part Manufacturer Model Serial

Number FCC

ID Cable

Description RTL

Bar

Code

Equipment

Arrival

Date

Laptop PC Dell Latitude D620

PP18L N/A DoC

Unshielded

Power N/A 4/10/2007

Laptop AC Adapter Dell LA65NS0-00 CN-0DF263-

71615682-

2ED4 N/A Unshielded 017737 4/10/2007

Monitor Mag Innovision LT716s 700P F6EQ581028

18U DoC Unshielded

Power

Shielded I/O 901427 12/15/2005

Speaker Boston Acoustics BA265 7002305 N/A Unshielded 011966 09/22/1999

USB Termination Gateway, Inc. USB PCB Rev 1.0 N/A Shielded 008645 04/07/1997

USB Termination Gateway, Inc. USB PCB Rev 1.0 N/A Shielded 011726 05/09/1996

Microphone Gateway, Inc. Telex 700358 N/A Unshielded 016989 01/24/2006

Ethernet hub Flowpoint 134 F258219 Class

Device Unshielded

Power 901278 10/04/2002

Modem US Robotics

Sportster Model

0413 8390364644

992 DoC Unshielded

Power

Shielded I/O 900427 11/13/1996

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 7 of 17

DoC Report

2006137

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2.5 CONFIGURATION OF TESTED SYSTEM

Laptop PC with

SanDisk SSD

SATA 5000

USB

Termination Monitor

Modem

Speaker Microphone

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 8 of 17

DoC Report

2006137

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3 PRODUCT LABELLING/ INFORMATION TO THE USER

3.1 DOC LABEL ON DEVICE

The label shall be located in a conspicuous location on the device and shall contain the unique

identification described in FCC CFR 47; Section 2.1074 (the unique model name), and the

following DoC logo:

SanDisk Corporation SanDisk SSD SATA 5000 2.5”

3.2 DOC STATEMENT IN USER’S MANUAL

For a Class B digital device or peripheral, per FCC CFR 47; Section 15.105, the instructions

furnished the user shall include the following or similar statement, placed in a prominent location

in the text of the manual:

NOTE: This equipment has been tested and found to comply with the limits for a Class B digital device,

pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against

harmful interference in a residential installation. This equipment generates, uses and can radiate radio

frequency energy and, if not installed and used in accordance with the instructions, may cause harmful

interference to radio communications. However, there is no guarantee that interference will not occur in a

particular installation. If this equipment does cause harmful interference to radio or television reception,

which can be determined by turning the equipment off and on, the user is encouraged to try to correct

the interference by one or more of the following measures:

—Reorient or relocate the receiving antenna.

—Increase the separation between the equipment and receiver.

—Connect the equipment into an outlet on a circuit different from that to which the receiver

is connected.

—Consult the dealer or an experienced radio/ TV technician for help.

3.3 LOCATION OF LABEL ON EUT

Label

Location

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 9 of 17

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4 CONDUCTED EMISSIONS

4.1 SITE AND TEST DESCRIPTION

The power line conducted emission measurements were performed in a Series 81 type shielded enclosure

manufactured by Rayproof. The EUT was assembled on a wooden table 80 centimeters high. Power was fed to

the EUT through a 50 ohm /50 microhenry Line Impedance Stabilization Network (EUT LISN). The EUT LISN

was fed power through an A.C. filter box on the outside of the shielded enclosure. The filter box and EUT LISN

housing are bonded to the ground plane of the shielded enclosure. A second LISN, the peripheral LISN,

provides isolation for the EUT test peripherals. This peripheral LISN was also fed A.C. power. A metal power

outlet box, which is bonded to the ground plane and electrically connected to the peripheral LISN, powers the

EUT host peripherals.

The spectrum analyzer was connected to the A.C. line through an isolation transformer. The 50-ohm output of

the EUT LISN was connected to the spectrum analyzer input through a Solar 7 kHz high-pass filter. The filter is

used to prevent overload of the spectrum analyzer from noise below 7 kHz. Conducted emission levels were

measured on each current-carrying line with the spectrum analyzer operating in the CISPR quasi-peak mode (or

average mode if applicable). The analyzer's 6 dB bandwidth was set to 9 kHz. No video filter less than 10 times

the resolution bandwidth was used. Average measurements are performed in linear mode using a 10 kHz

resolution bandwidth, a 1 Hz video bandwidth, and by increasing the sweep time in order to obtain a calibrated

measurement. The range of the frequency spectrum to be investigated is specified in FCC Part 15. The highest

emission amplitudes relative to the appropriate limit were measured and have been recorded in this report.

360 Herndon Parkway

Suite 1400

Herndon, VA 20170

http://www.rheintech.com

SanDisk Corporation Page 10 of 17

DoC Report

2006137

04/27/07

4.2 CONDUCTED EMISSIONS TEST DATA

Mode: 115 vac, 60 Hz.

Neutral Conductor Temperature: 75°F Humidity: 31%

Emission

Frequency

(MHz)

Test

Detector Analyzer

Reading

(dBuV)

Site

Correction

Factor

(dB)

Emission

Level

(dBuV)

CISPR B

Limit

(dBuV)

CISPR B

Margin

(dBuV)

CISPR B

Limit

(dBuV)

CISPR B

Margin

(dBuV)

Pass/

Fail

0.157 Qp 56.2 0.2 56.4 65.6 -9.2 55.6 Pass

0.157 Av 33.4 0.2 33.6 65.6 -32.0 55.6 -22.0 Pass

0.186 Qp 54.7 0.2 54.9 64.2 -9.3 54.2 Pass

0.186 Av 21.8 0.2 22.0 64.2 -42.2 54.2 -32.2 Pass

0.212 Qp 42.4 0.2 42.6 63.1 -20.5 53.1 -10.5 Pass

0.221 Qp 43.7 0.2 43.9 62.8 -18.9 52.8 -8.9 Pass

0.265 Qp 46.6 0.2 46.8 61.3 -14.5 51.3 -4.5 Pass

0.320 Qp 54.0 0.3 54.3 59.7 -5.4 49.7 Pass

0.320 Av 29.3 0.3 29.6 59.7 -30.1 49.7 -20.1 Pass

0.372 Qp 51.7 0.3 52.0 58.5 -6.5 48.5 Pass

0.372 Av 30.9 0.3 31.2 58.5 -27.3 48.5 -17.3 Pass

0.710 Pk 40.4 0.2 40.6 56.0 -15.4 46.0 -5.4 Pass

1.650 Pk 35.5 0.7 36.2 56.0 -19.8 46.0 -9.8 Pass

4.450 Pk 35.6 1.3 36.9 56.0 -19.1 46.0 -9.1 Pass

15.070 Pk 25.2 2.3 27.5 60.0 -32.5 50.0 -22.5 Pass

17.640 Pk 28.2 2.5 30.7 60.0 -29.3 50.0 -19.3 Pass

25.100 Pk 29.4 2.7 32.1 60.0 -27.9 50.0 -17.9 Pass

Phase Conductor Temperature: 75°F Humidity: 31%

Emission

Frequency

(MHz)

Test

Detector Analyzer

Reading

(dBuV)

Site

Correction

Factor

(dB)

Emission

Level

(dBuV)

CISPR B

Limit

(dBuV)

CISPR B

Margin

(dBuV)

CISPR B

Limit

(dBuV)

CISPR B

Margin

(dBuV)

Pass/

Fail

0.155 Qp 58.5 0.2 58.7 65.7 -7.0 55.7 Pass

0.155 Av 34.7 0.2 34.9 65.6 -30.7 55.6 -20.7 Pass

0.186 Qp 54.5 0.2 54.7 64.2 -9.5 54.2 Pass

0.186 Av 20.8 0.2 21.0 64.2 -43.2 54.2 -33.2 Pass

0.213 Qp 52.2 0.2 52.4 62.7 -10.3 52.7 Pass

0.213 Av 38.1 0.2 38.3 63.1 -24.8 53.1 -14.8 Pass

0.265 Qp 46.6 0.2 46.8 61.3 -14.5 51.3 -4.5 Pass

0.294 Qp 41.0 0.3 41.3 60.4 -19.1 50.4 -9.1 Pass

0.377 Qp 39.8 0.3 40.1 58.3 -18.2 48.3 -8.2 Pass

0.423 Qp 39.6 0.2 39.8 57.4 -17.6 47.4 -7.6 Pass

0.500 Pk 38.5 0.2 38.7 56.0 -17.3 46.0 -7.3 Pass

2.740 Pk 31.2 1.0 32.2 56.0 -23.8 46.0 -13.8 Pass

9.910 Pk 24.0 1.9 25.9 60.0 -34.1 50.0 -24.1 Pass

18.640 Pk 28.0 2.6 30.6 60.0 -29.4 50.0 -19.4 Pass

25.070 Pk 29.8 2.7 32.5 60.0 -27.5 50.0 -17.5 Pass

28.850 Pk 22.2 3.1 25.3 60.0 -34.7 50.0 -24.7 Pass

Result: PASS

Test Personnel:

Jon Wilson

April 10, 2007

Tester Signature Date of Test

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