HP 1660 Series Manuel utilisateur

Service Guide

Publication number 01660-97002

First edition, August 1993

For Safety information, Warranties, and Regulatory

information, see the pages at the end of the book.

Copyright Hewlett-Packard Company 1987–1993

All Ri ght s Reser ved.

HP 1660 Series

Logic Analyzers

Printed in USA July 2004

Notice

Hewlett-Packard to Agilent Technologies Transition

This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-

Packard’s former test and measurement, semiconductor products and chemical analysis

businesses are now part of Agilent Technologies. To reduce potential confusion, the only

change to product numbers and names has been in the company name prefix: where a

product name/number was HP XXXX the current name/number is now Agilent XXXX. For

example, model number HP8648 is now model number Agilent 8648.

Contacting Agilent Sales and Service Offices

The sales and service contact information in this manual may be out of date. The latest

service and contact information for your location can be found on the Web at:

http://www.agilent.com/find/assist

If you do not have access to the Internet, contact your field engineer or the nearest sales

and service office listed below. In any correspondence or telephone conversation, refer to

your instrument by its model number and full serial number.

United States

(tel) 1 800 452 4844

(fax) 1 800 829 4433

Latin America

(tel) (305) 269 7500

(fax) (305) 269 7599

New Zealand

(tel) 0 800 738 378

(fax) 64 4 495 8950

Canada

(tel) +1 877 894 4414

(fax) +1 888 900 8921

Japan

(tel) (81) 426 56 7832

(fax) (81) 426 56 7840

Asia Pacific

(tel) (852) 3197 7777

(fax) (852) 2506 9284

Europe

(tel) (31 20) 547 2323

(fax) (31 20) 547 2390

Australia

(tel) 1 800 629 485

(fax) (61 3) 9210 5947

HP 1660A Series and HP 1660AS Series

Logic Analyzers

The HP 1660A Series are 100-MHz State/500-MHz Timing Logic Analyzers.

The HP 1660AS Series include all the features of the HP 1660A Series, as well as a

2-channel, 1 GSa/s oscilloscope.

Feat uresFeat ures

Some of the main features of the HP 1660 Series Logic Analyzers are as follows:

•128 data channels and 6 clock/data channels in the HP 1660A

•96 data channels and 6 clock/data channels in the HP 1661A

•64 data channels and 4 clock/data channels in the HP 1662A

•32 data channels and 2 clock/data channels in the HP 1663A

•3.5-inch disk drive

•HP-IB and RS-232C interface

•Variable setup/hold time

•4 kbytes deep memory on all channels with 8 kbytes in half channel mode

•Marker measurements

•12 levels of trigger sequencing for state and 10 levels of sequential triggering for

timing

•100 MHz time and number-of-states tagging

•Full programmability

The HP 1660AS Series Logic Analyzers also include the following features:

•1 GSa/s digitizing for 250 MHz bandwidth single shot oscilloscope

•8000 samples per channel

•Automatic pulse parameters, displays time between markers, acquires until

specified time between markers is captured, performs statistical analysis on time

between markers

•Lightweight miniprobes

Ser vi ce St r at egySer vi ce St r at egy

The service strategy for this instrument is the replacement of defective assemblies.

This service guide contains information for finding adefective assembly by testing

and servicing the HP 1660 Series.

This logic analyzer can be returned to Hewlett-Packard for all service work, including

troubleshooting. Contact your nearest Hewlett-Packard Sales Office for more details.

The HP 1660-series Logic Analyzer

iii

In This Book

This book is the service guide for the HP 1660 Series Logic Analyzers and is divided into

eight chapters.

Chapt er 1 cont ains informat i on about t he logi c analyzer and i ncludes accessor ies,

specifications and characteristics, and equipment required for servicing.

Chapter 2 tells how t o prepare t he logic analyzer for use.

Chapt er 3 gives inst r uct ions on how t o t est t he perfor mance of t he logic analyzer.

Chapter 4 contains calibration instructions for the logic analyzer.

Chapter 5 contains self-tests and flowcharts for troubleshooting the logic analyzer.

Chapter 6 tellshow to replace assembliesof the logic analyzer and how to return them to

Hewlett-Packard.

Chapter 7 lists replaceable part s, shows an exploded view, and gives ordering information.

Chapter 8 explains how the logic analyzer works and what t he self-tests are checking.

Contents

11 Gener al I nfor mat ionGeneral Information

Accessories 1-2

Specifications (logic analyzer) 1-3

Specifications (oscilloscope) 1-4

Char act er ist ics ( logic analyzer ) 1-5

Characteristics (oscilloscope) 1-5

Supplemental Characteristics (logic analyzer) 1-6

Supplemental Characteristics (oscilloscope) 1-9

Recommended Test Equipment (Logic Analyzer) 1-13

Recommended Test Equipment (Oscilloscope) 1-14

22 Preparing for UsePreparing for Use

To inspect the logic analyzer 2-2

To apply power 2-3

To operate the user interface 2-3

To set the line voltage 2-3

To degauss t he display 2-4

To clean t he logic analyzer 2-4

To test the logic analyzer 2-4

33 Testing PerformanceTesting Performance

To perform the self-tests 3-3

To make the test connectors (logic analyzer) 3-6

To test the threshold accuracy (logic analyzer) 3-8

Set up the equipment 3-8

Set up the logic analyzer 3-9

Connect the logic analyzer 3-9

Test theTTL threshold 3-10

Test theECL threshold 3-12

Test the- User threshold 3-13

Test the+ User threshold 3-14

Test the 0 VUser threshold 3-15

Test the next pod 3-16

To test the glitch capture ( logic analyzer) 3-17

Set up the equipment 3-17

Set up the logic analyzer 3-18

Connect the logic analyzer 3-18

Test the glitch capture on the connected channels 3-20

Test the next channels 3-22

To test the single-clock, single-edge, state acquisition ( logic analyzer) 3-23

Set up the equipment 3-23

Set up the logic analyzer 3-24

Connect the logic analyzer 3-25

Verify t he t est si gnal 3-28

Check the setup/hold combination 3-30

Test the next channels 3-34

To test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3-35

Set up the equipment 3-35

Set up the logic analyzer 3-36

Connect the logic analyzer 3-38

Verify t he t est si gnal 3-40

Check the setup/hold with single clock edges, multiple clocks 3-42

Test the next channels 3-46

To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3-47

Set up the equipment 3-47

Set up the logic analyzer 3-48

Connect the logic analyzer 3-50

Verify t he t est si gnal 3-52

Check the setup/hold with single clock, multiple clock edges 3-54

Test the next channels 3-58

To test the timeinterval accuracy (logic analyzer) 3-59

Set up the equipment 3-59

Set up the logic analyzer 3-60

Connect the logic analyzer 3-62

Acquirethedata 3-63

To test the CAL OUTPUT ports (oscilloscope) 3-64

Set up the equipment 3-64

Set up the logic analyzer 3-65

Verify the DC CAL OUTPUT port 3-66

Set up the logic analyzer 3-67

Verify the ACCAL OUTPUT port 3-67

To test the input resistance (oscilloscope) 3-68

Set up the equipment 3-68

Set up the logic analyzer 3-69

Connect the logic analyzer 3-70

Acquirethedata 3-71

Perform an operational accuracy calibration 3-71

Contents

To test the voltage measurement accuracy (oscilloscope) 3-72

Set up the equipment 3-72

Set up the logic analyzer 3-73

Connect the logic analyzer 3-74

Acquirethedata 3-75

To test the offset accuracy (oscilloscope) 3-76

Set up the equipment 3-76

Set up the logic analyzer 3-77

Connect the logic analyzer 3-78

Acquire the zero input data 3-79

Acquire the DC input data 3-80

To test the bandwidth (oscilloscope) 3-81

Set up the equipment 3-81

Set up the logic analyzer 3-82

Connect the logic analyzer 3-84

Acquirethedata 3-85

To test the time measurement accuracy (oscilloscope) 3-86

Set up the equipment 3-86

Set up the logic analyzer 3-87

Connect the logic analyzer 3-89

Acquirethedata 3-89

To test the trigger sensit ivity ( oscilloscope) 3-90

Set up the equipment 3-90

Set up the logic analyzer 3-91

Connect the logic analyzer 3-93

Acquirethedata 3-93

Performance Test Record ( logic analyzer) 3-94

Performance Test Record (oscilloscope) 3-101

44 Calibrating and AdjustingCalibrating and Adjusting

Logic analyzer calibration 4-2

To calibrate the oscilloscope 4-3

Set up the equipment 4-3

Load the Default Calibration Factors 4-4

Self Cal menu calibrations 4-5

To adjust theCRT monitor alignment 4-6

To adjust the CRT intensity 4-8

Contents

vii

55 TroubleshootingTroubleshooting

To usethe flowcharts 5-2

To check the power-up tests 5-15

To run the self-tests 5-16

To test the power supply voltages 5-22

To t est t he CRT monit or signal s 5-24

To t est t he keyboard signal s 5-25

To test the disk drive voltages 5-26

To perform theBNCtest 5-28

To test the logic analyzer probe cables 5-29

To test the auxiliary power 5-33

66 Replacing AssembliesReplacing Assemblies

To remove and replace the handle 6-5

To remove and replace the feet and tilt stand 6-5

To remove and replace the cover 6-5

To remove and replace the disk drive 6-6

To remove and replace the power supply 6-7

To remove and replace the CPU board 6-7

To remove and replace t he swit ch act uat or assembly 6-8

To remove and replace the rear panel assembly 6-9

To remove and replace the acquisition board (oscilloscope board for HP1660AS-series) 6-10

To remove and replace the front panel and keyboard 6-11

To remove and replace the intensity adjustment 6-11

To remove and replace the monitor 6-12

To remove and replace the handle plate 6-12

To remove and replace the fan 6-13

To remove and replace the line filter 6-13

To remove and replace the HP-IB and RS-232C cables 6-14

To ret urn assembl ies 6-15

77 Replaceable Part sReplaceable Parts

Replaceable Parts Ordering 7-2

Exploded View 7-3

Replaceable Parts List 7-4

Power Cables and Plug Configurations 7-8

Contents

viii

88 Theory of OperationTheor y of Operat ion

Block-Level Theory 8-3

The HP 1660 Series Logic Analyzer 8-3

The Logic Acquisition Board 8-6

The Oscilloscope Board 8-9

Self-Tests Description 8-12

Power-up Self-Tests 8-12

Syst em Test s ( Syst em PV) 8-13

Analyzer Tests ( Analy PV) 8-16

Oscilloscope Tests (Scope PV) 8-18

HP-IB 8-19

RS-232C 8-20

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